The handbook covers:
- The basics of parallel parametric test
- The parallel test implementation process
- Applying parallel parametric test to existing hardware setups
- Test structure design for parallel testing
Keithley’s Parallel Test Technology handbook also contains a section with sample programming code for a typical parallel test setup using pt_execute and a glossary of common parallel parametric test terminology.
For More Information. To request a free copy of the Parallel Test Technology handbook or for more information on Keithley's semiconductor parametric test and measurement systems, data acquisition products, or test and measurement solutions, visit http://ggcomm.com/Keithley/PPTHandbook.html or contact the company at:
Telephone: 800-688-9951
440-248-0400
FAX: 440-248-6168
E-mail: publisher@keithley.com
Internet: www.keithley.com
Address: Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891
About Keithley. With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our products solve emerging measurement needs in production testing, process monitoring, product development, and research. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of precision measurement technology and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.
Products and company names listed are trademarks or trade names of their respective companies.

